隨機(jī)逼近用于中心設(shè)計(jì)的一種新方法
A NEW APPROACH FOR DESIGN CENTERING BASED ON STOCHASTIC APPROXIMATION
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摘要: 本文提出了一種新的中心設(shè)計(jì)方法。該方法將一維搜索法與隨機(jī)逼近優(yōu)化法相結(jié)合,利用二次模型對(duì)參數(shù)空間上電路的響應(yīng)進(jìn)行近似,采用相關(guān)抽樣和二次模型對(duì)設(shè)計(jì)參數(shù)的不同中心值進(jìn)行Monte carlo分析,估計(jì)電路的成品率。實(shí)例表明,該方法收斂較快,進(jìn)行優(yōu)化設(shè)計(jì)所需時(shí)間較少。Abstract: A new optimization technique which combines one dimension exploration with stochastic approximation is presented. A quadratic model is used to approximate the response of a circuit over a parameter space. The circuit yield for different design center values is estimated using correlated sampling and quadratic model via Monte Carlo method. An example shows that the convergence of this approach is faster and required CPU-time is less.
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Z. H. Wang, R. H. Liu, C. Z. Fan, Yield Simulation and Optimization for Electronic Circuits, ICCAS, Nanjing, China, (1989), pp. 334-337.[2]M. A. Stybinski, A. Ruszezynki, Electron. Lett., 19(1983)8, 300-302.[3]M. A. Stybinski, Statistic Circuit Design with a Dynamic Constraint Approximation Scheme, ISCAS, New-port Beach, California, (1983), pp. 554-557.[4]R. M. Biernacki, J. W. Bander, Jian Song, Qijun Zhang, IEEE Trans. on CAD, CAD-36(1989)11, 1449-1454. -
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