高速多芯片組件同步開關(guān)噪聲的二維特征法全波分析
FULL WAVE ANALYSIS OF SIMULTANEOUS SWITCHING NOISE IN HIGH SPEED MCM BY THE METHOD OF CHARACTERISTICS
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摘要: 高速多芯片組件(MCM)廣泛用于高復(fù)雜度的系統(tǒng)中,而其中的同步開關(guān)噪聲(Simultaneous Switching Noise)是影響系統(tǒng)功能的重要因素.本文采用二維電磁模型模擬MCM電源、接地板同步開關(guān)噪聲;文中提出一種新的時(shí)域電磁問題的數(shù)值方法特征法,并用于求解上述問題,所得結(jié)果與FD-TD計(jì)算的結(jié)果和文獻(xiàn)報(bào)道一致.
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關(guān)鍵詞:
- 多芯片組件; 同步開關(guān)噪聲; 特征法
Abstract: High speed Multi-Chip Module (MCM) has been widely adopted in the complex system, where Simultaneous Switching Noise is one of the key factors affecting the system function. In this paper, two dimensional electromagnetic model is used to simulate power/ground plane simultaneous switching noise in MCM. A novel numerical method for the time-domain electromagnetic problems, named Method of Characteristics, is presented and used to solve the above problem. The results obtained is in accordance with that by the method of FD-TD and that reported by literature. -
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