雙極模擬集成電路的參數(shù)統(tǒng)計(jì)性分析
THE PARAMETER STATISTICAL ANALYSIS FOR BIPOLAR ANALOGOUS INTEGRATED CIRCUIT DESIGN
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摘要: 本文給出了實(shí)現(xiàn)雙極模擬集成電路參數(shù)統(tǒng)計(jì)相關(guān)性分析的步驟和方法,提出了含對(duì)稱參數(shù)分析的雙參數(shù)(BF,RS)統(tǒng)計(jì)分析方法。實(shí)例分析和對(duì)比表明,該方法適于模擬集成電路的分析和設(shè)計(jì)。
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關(guān)鍵詞:
- 模擬集成電路; 參數(shù)統(tǒng)計(jì)分析; 相關(guān)性分析
Abstract: The method and procedure for realizing parameter statistical correlation analysis of bipolar analongous integrated circuits are given, and a statistical method of double parame-ters (BF, Rs) with some symmetrical parameters is suggested. Based on the comparision and analysis of the circuits, it is shown that the method can be used to analyse and design bipolar analogous integrated circuits. -
D. A. Divakar, IEEE J. of SC, SC-12(1977)10, 552-559.[2]P. Balaban, IEEE Trans. on CAS, CAS-22(1975)2,100-108.[3]S. Inohira, IEEE Trans. on CAD, CAD-4(1985)4, 621-627.[4]J. Logan, Bell Syst. Tech. J., 50(1971)4, 1105-1174.[5]郝躍,姚立真等,電子科學(xué)學(xué)刊,10(1988)6,501-506. -
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