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基于螞蟻算法和遺傳算法的時序電路測試生成

許川佩,  李智,  莫瑋

許川佩, 李智, 莫瑋. 基于螞蟻算法和遺傳算法的時序電路測試生成[J]. 電子與信息學(xué)報, 2005, 27(7): 1157-1161.
引用本文: 許川佩, 李智, 莫瑋. 基于螞蟻算法和遺傳算法的時序電路測試生成[J]. 電子與信息學(xué)報, 2005, 27(7): 1157-1161.
Xu Chuan-pei, Li Zhi, Mo Wei . Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm[J]. Journal of Electronics & Information Technology, 2005, 27(7): 1157-1161.
Citation: Xu Chuan-pei, Li Zhi, Mo Wei . Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm[J]. Journal of Electronics & Information Technology, 2005, 27(7): 1157-1161.

基于螞蟻算法和遺傳算法的時序電路測試生成

Test Generation of Sequential Circuits Based on Ant Algorithm and Genetic Algorithm

  • 摘要: 為提高時序電路的測試生成效率,該文提出一種新的基于螞蟻算法和遺傳算法的時序電路測試矢量生成算法.針對國際標(biāo)準(zhǔn)時序電路的實驗結(jié)果表明,該交叉算法既充分發(fā)揮了兩種算法的優(yōu)點,又克服了各自的缺點,與其它同類測試生成算法相比,獲得了較好的故障覆蓋率和測試集.說明采用螞蟻算法和遺傳算法的交叉算法是成功的.
    Abstract: This paper presents a new test pattern generation technique based on ant algorithm and genetic algorithm for improving the test generation efficiency for sequential circuits. Experimental results for the sequential benchmark circuits show that the hybrid approach not only takes full advantage of utilizing both algorithms, but also overcomes their disadvantages. It can achieve higher fault coverages and more compact test sets when compared to other similar test generation algorithms, demonstrating the combined algorithm is a successful algorithm.
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  • Niermann T M, Patel J H. HITEC: A test generation package for sequential circuits. Proc. European Conf. Design Automation, Amsterdam, the Netherlands, 1992:214 - 218.[2]Cabodi G, Camurati P, Quer S. Symbolic exploration of large circuits with enhanced forward/backward traversals. Proc.EURODAC, Grenoble, Fr., 1994:22 - 27.[3]Saab D G, Saab Y G, Abraham J A. CRIS: A test cultivation program for sequential VLSI circuits. Proc. Int. Conf. Computer -Aided Design, Santa Clara, USA, 1992:216 - 219.[4]Rudnick E M, Patel J H, Greenstein G S, Niermann T M.Sequential circuit test generation in a genetic algorithm framework. Proc. Design Automation Conf., San Diego, USA,1994:698- 704.[5]李智,許川佩,陳光(禵).基于螞蟻算法的同步時序電路初始化研究.電子測量與儀器學(xué)報,2002,(4):33-38.[6]李智,許川佩,莫瑋,陳光(禵).基于螞蟻算法和遺傳算法的同步時序電路初始化.電子學(xué)報,2003,(8):1276-1280.[7]Hsiao M S, Rudnick E M, Patel J H. Dynamic state traversal for sequential circuit test generation[J].ACM Trans. on Design Automation of Electronic Systems.2000, 5(2):548-[8]陳國良,等.遺傳算法及其應(yīng)用.北京:電子工業(yè)出版社,1996.6:88-97.
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出版歷程
  • 收稿日期:  2004-02-09
  • 修回日期:  2004-08-10
  • 刊出日期:  2005-07-19

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