一種基于旋轉(zhuǎn)測量的陣列幅相誤差校正新方法

程豐; 龔子平; 張馳; 萬顯榮

doi:10.11999/JEIT161058

一種基于旋轉(zhuǎn)測量的陣列幅相誤差校正新方法

doi: 10.11999/JEIT161058 cstr: 32379.14.JEIT161058

基金項目:

CEMEE國家重點(diǎn)實驗室主任基金(CEMEE2014 Z0101B)，國家自然科學(xué)基金(U1333106, 61331012, 61371197)，國家重點(diǎn)研發(fā)計劃(2016YFB0502403)

計量
- 文章訪問數(shù): 1410
- HTML全文瀏覽量: 194
- PDF下載量: 302
- 被引次數(shù): 0
出版歷程
- 收稿日期: 2016-10-12
- 修回日期: 2017-04-24
- 刊出日期: 2017-08-19

A New Rotation Measurement-based Method for Array Gain-phase Errors Calibration

Funds:

The Director Foundation of The State Key Laboratory of CEMEE (CEMEE2014Z0101B), The National Natural Science Foundation of China (U1333106, 61331012, 61371197), The National Key RD Plan (2016YFB0502403)

摘要

摘要: 校正源信號方向角不容易精確測量，限制了陣列有源校正方法的精度。另一方面，無源校正方法難以應(yīng)用于存在大陣列誤差的場合，其實際應(yīng)用也受到嚴(yán)重限制。該文提出一種基于旋轉(zhuǎn)測量的陣列幅相誤差校正新方法，無需測量校正源信號方向角就能獲得較高的校正精度。該方法利用已知的陣列旋轉(zhuǎn)角度，基于最大似然準(zhǔn)則獲得陣列幅相誤差、校正源信號方向角及其復(fù)振幅的無模糊估計。相對于校正源信號方向角，陣列旋轉(zhuǎn)角度通過專用測試轉(zhuǎn)臺更容易精確測量，因此該方法能以較小的代價獲得很高的校正精度。仿真實驗驗證了該方法的有效性和通用性。
- 陣列校正 /
- 幅相誤差 /
- 校正精度 /
- 旋轉(zhuǎn)測量 /
- 測試轉(zhuǎn)臺
Abstract: It is not easy to accurately measure the direction angles of calibration-source signals, which limits the precision of array active-calibration methods. On the other hand, passive-calibration methods are difficult to apply to the presence of large array errors, which severely limits their practical applications. This paper proposes a rotation measurement-based method to calibrate array gain-phase errors, which can achieve high calibration precision without measuring the direction angles of calibration-source signals. Using the known array-rotation angles, the maximum likelihood-based method is able to simultaneously estimate the array gain-phase errors, direction angles and complex amplitudes of calibration-source signals without ambiguity. Compared with accurately measuring the direction angles of calibration-source signals, accurately measuring the array-rotation angles is much easier to be accomplished with a special test turntable, thus the proposed method can achieve quite high calibration precision at a low cost. Some simulation tests demonstrate the effectiveness and generality of the proposed method.
- Array calibration /
- Gain-phase errors /
- Calibration precision /
- Rotation measurement /
- Test turntable

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