一種基于FPGA的微處理器軟錯(cuò)誤敏感性分析方法
doi: 10.11999/JEIT160225 cstr: 32379.14.JEIT160225
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(合肥工業(yè)大學(xué)電子科學(xué)與應(yīng)用物理學(xué)院 合肥 230009) ②(合肥工業(yè)大學(xué)計(jì)算機(jī)與信息學(xué)院 合肥 230009)
國家自然科學(xué)基金(61274036, 61371025, 61474036, 61574052),安徽省自然科學(xué)基金(1608085MF149)
FPGA-based Soft Error Sensitivity Analysis Method for Microprocessor
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1.
(School of Electronic Science &
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2.
(School of Electronic Science &
The National Natural Science Foundation of China (61274036, 61371025, 61474036, 61574052), Anhui Provincial Natural Science Foundation (1608085MF149)
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摘要: 為了自動(dòng)快速地分析微處理器對軟錯(cuò)誤的敏感性,該文提出一種基于FPGA故障注入的軟錯(cuò)誤敏感性分析方法。在FPGA芯片上同時(shí)運(yùn)行有故障和無故障的兩個(gè)微處理器,并充分利用FPGA的并行性,把故障注入控制、故障分類、故障列表等模塊均在硬件上實(shí)現(xiàn),自動(dòng)快速地完成全部存儲(chǔ)位的故障注入。以PIC16F54微處理器為實(shí)驗(yàn)對象,基于不同負(fù)載分別注入約30萬個(gè)軟錯(cuò)誤用以分析微處理器軟錯(cuò)誤敏感性,并對敏感性較高的單元加固后再次進(jìn)行分析,驗(yàn)證該方法的有效性。實(shí)驗(yàn)數(shù)據(jù)表明,使用該方法進(jìn)行故障注入及敏感性分析所需的時(shí)間比軟件仿真方法提高了4個(gè)數(shù)量級。
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關(guān)鍵詞:
- FPGA /
- 故障注入 /
- 單粒子翻轉(zhuǎn) /
- 軟錯(cuò)誤 /
- 敏感性分析
Abstract: In order to quickly and automatically analyze the soft error sensitivity for microprocessors, a soft error sensitivity analysis method using FPGA-based fault injection is proposed. The fault and fault-free microprocessors on a FPGA are board run simultaneously. Moreover, a fault injection controller, a fault classification module and a fault list module are also implemented on the hardware. The method inherits the parallelism of the FPGA and achieves a fast and automatical fault injection for all storage bits. Further, using a PIC16F54 microprocessor as experimental subject, approximate 300, 000 soft errors are injected into the microprocessors to analyze its soft error sensitivity. In order to demonstrate the sensitivity evaluation efficiency of the method, the quite sensitive storage cells are hardened and the sensitivity is analyzed again. Compared to the simulation approach, experimental results show that the proposed technique achieves four orders of magnitude speedup.-
Key words:
- FPGA /
- Fault injection /
- Single event upset /
- Soft error /
- Sensitivity analysis
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