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介質(zhì)復(fù)數(shù)介電常數(shù)的微波測(cè)量

張金標(biāo),  邵方武

張金標(biāo), 邵方武. 介質(zhì)復(fù)數(shù)介電常數(shù)的微波測(cè)量[J]. 電子與信息學(xué)報(bào), 1988, 10(1): 92-96.
引用本文: 張金標(biāo), 邵方武. 介質(zhì)復(fù)數(shù)介電常數(shù)的微波測(cè)量[J]. 電子與信息學(xué)報(bào), 1988, 10(1): 92-96.
Zhang Jinbiao, Shao Fangwu. MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT[J]. Journal of Electronics & Information Technology, 1988, 10(1): 92-96.
Citation: Zhang Jinbiao, Shao Fangwu. MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT[J]. Journal of Electronics & Information Technology, 1988, 10(1): 92-96.

介質(zhì)復(fù)數(shù)介電常數(shù)的微波測(cè)量

MICROWAVE MEASUREMENT OF COMPLEX DIELECTRIC CONSTANT

  • 摘要: 本文推廣了Roberts-Hippel公式,對(duì)介質(zhì)中相位常數(shù)編制的計(jì)算程序使我們能很快地得到它的多值解。該方法不需要特殊設(shè)備,但能滿足一般介質(zhì)材料的測(cè)量精度要求。
    Abstract: ABSTRACT In this paper, the formula given by S. Roberts and A. Von Hippel (1946) has been expanded. We make a program for calculating the phase constant of tested material which is put into the waveguide and for obtaining the multi-value solutions. The method for determining r and tan of a rested material does not need special equipments, but it can meet the accuracy requirement for resting ordinary materials.
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  • W. E. Courtney, IEEE Trans. on MTT, MTT-18(1970), 467.[2]S. Roberts, A. Von Hippel, J. Appl. Phys., 17(1946), 610.[3]T. W. Dakin, C. N. Works, J. Appl. Phys., 18(1947), 789-796.[4]D. M. Bowie and K. S. Kelleher, IRE Trans. on MTT, MTT-4(1956), 137.
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  • 收稿日期:  1986-05-28
  • 修回日期:  1987-01-05
  • 刊出日期:  1988-01-19

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