晶體管放大器的閃變調(diào)相噪聲
FLICKER PHASE NOISE IN TRANSISTORIZED AMPLIFIER
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摘要: 本文導出了由晶體管高頻調(diào)諧放大器的閃變調(diào)相噪聲,決定的頻率穩(wěn)定度(頻域的表征相位功率譜密度S△'1(f)和時域的表征阿倫方差y2())與晶體管參數(shù)的關系式,并進行了實驗驗證。
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關鍵詞:
Abstract: The relation betweem the frequency stability due to the flicker phase noise (phase power spectrum density S△(f) in frequency domain and Allen variance y2() in time domain) and the parameters of the transistors have been derived and experimen-tally verified. -
小宮山牧児, 安田嘉之,電子通信學會論文志,J60-B(1977),197.[2]張鳳祥,電子計測與頻率控制,1980年,第4期,第68頁.[3]張鳳祥,電子學通訊,4(1982), 145.[4]武者利光,応用物理,46(1977), 1144.[5]津田建二,日經(jīng)エレクトロニクワス,第196號,(1978),p.66.[6]張鳳祥,宇航計測技術,1982年,第3期,第44頁. -
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